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1

Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process

Mu-Chun Wang, Chuan-Hsi Liu, Kuo-Shu Huang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Hsin-Chia Yang, Chii-Ruey Lin

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 2.11 MB

english, 2010

2

[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - Off-state current behaviors of 28nm-node nMOSFETs under negative gate bias

Chen, Yan-Ting, Hsu, Ko-Chin, Huang, Heng-Sheng, Chen, Shuang-Yuan, Wang, Shea-Jue, Wang, Mu-Chun

Year:

2018

File:

PDF, 856 KB

2018

3

[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - The μeq fitting for mixed current model of MOSFETs considering horizontal electric field

Huang, Heng-Sheng, Huang, Ping-Ray, Chen, Shuang-Yuan, Wang, Shea-Jue, Wang, Wei-Lun, Wang, Mu-Chun, Huang, L S

Year:

2018

Language:

english

File:

PDF, 708 KB

english, 2018

4

[IEEE 2018 7th International Symposium on Next Generation Electronics (ISNE) - Taipei, Taiwan (2018.5.7-2018.5.9)] 2018 7th International Symposium on Next Generation Electronics (ISNE) - Observation of degradation and recovery of stacked HfOx/ZrOy/HfOx MOSFETs

Chang, Chih-Chieh, Sung, Shun-Ping, Huang, Heng-Sheng, Chen, Shuang-Yuan, Wang, Shea-Jue, Wang, Mu-Chun

Year:

2018

Language:

english

File:

PDF, 847 KB

english, 2018

5

[ASME 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Clear Water Bay, Kowloon, Hong Kong (Tuesday 3 June 2008)] 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Simulation and Improvement of 5GHz Power Divider on FR-4 PCB

Wang, Mu-Chun, Kuo, Chung-Hsin, Hsieh, Zhen-Ying, Huang, Chun-Wei, Chen, Shuang-Yuan

Year:

2008

Language:

english

File:

PDF, 438 KB

english, 2008

6

The switch of the worst case on NBTI and hot-carrier reliability for 0.13 μm pMOSFETs

Chia-Hao Tu, Shuang-Yuan Chen, Meng-Hong Lin, Mu-Chun Wang, Ssu-Han Wu, Sam chou, Joe Ko, Heng-Sheng Huang

Journal:

Applied Surface Science

Year:

2008

Language:

english

File:

PDF, 822 KB

english, 2008

7

Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs

Zhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 616 KB

english, 2009

8

Substrate current verifying lateral electrical field under forward substrate biases for nMOSFETs

Heng-Sheng Huang, Mu-Chun Wang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Ai-Erh Chuang, Chuan-Hsi Liu

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 363 KB

english, 2010

9

Investigating the Multiple Roles of Polyvinylpyrrolidone for a General Methodology of Oxide Encapsulation

Sun, Hang, He, Jiating, Wang, Jiangyan, Zhang, Shuang-Yuan, Liu, Cuicui, Sritharan, Thirumany, Mhaisalkar, Subodh, Han, Ming-Yong, Wang, Dan, Chen, Hongyu

Journal:

Journal of the American Chemical Society

Year:

2013

Language:

english

File:

PDF, 1.66 MB

english, 2013

10

[IEEE 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2009.10.21-2009.10.23)] 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference - A study to stencil printing technology for solder bump assembly

Mu-Chun Wang,, Zhen-Ying Hsieh,, Kuo-Shu Huang,, Chiao-Hao Tu,, Shuang-Yuan Chen,, Heng-Sheng Huang,

Year:

2009

Language:

english

File:

PDF, 1.57 MB

english, 2009

11

Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment

Wang, Shea-Jue, Wang, Mu-Chun, Chen, Shuang-Yuan, Lan, Wen-How, Yang, Bor-Wen, Huang, L.S., Liu, Chuan-Hsi

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 1.12 MB

english, 2015

12

[ASME 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Clear Water Bay, Kowloon, Hong Kong (Tuesday 3 June 2008)] 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Investigation of Dicing Saw Methods Impacting Back-End Assembly Process

Wang, Mu-Chun, Hsieh, Zhen-Ying, Huang, Kuo-Shu, Chen, Shuang-Yuan, Huang, Heng-Sheng

Year:

2008

Language:

english

File:

PDF, 222 KB

english, 2008

13

[IEEE 2019 8th International Symposium on Next Generation Electronics (ISNE) - Zhengzhou, China (2019.10.9-2019.10.10)] 2019 8th International Symposium on Next Generation Electronics (ISNE) - Nano-node n-type Gate Dielectric Integrity and Uniformity Correlated to Nitridation Process

Chang, Chih-Chieh, Lu, Chih-Cheng, Wang, Mu-Chun, Huang, Heng-Sheng, Chen, Shuang-Yuan, Wang, Shea-Jue

Year:

2019

Language:

english

File:

PDF, 320 KB

english, 2019

14

Spontaneous radiation from a V-type three-level atom in three-dimensional photonic crystals

Ya-ping Yang, Shuang-yuan Xie, Hong Chen, Shi-Yao Zhu, Xiang Wu

Journal:

Optics Communications

Year:

2000

Language:

english

File:

PDF, 419 KB

english, 2000

15

Chemoprevention of hepatocellular carcinoma in aflatoxin endemic areas

Thomas W. Kensler, Patricia A. Egner, Jin-Bing Wang, Yuan-Rong Zhu, Bao-Chu Zhang, Pei-Xin Lu, Jian-Guo Chen, Geng-Sun Qian, Shuang-Yuan Kuang, Peta E. Jackson, Stephen J. Gange, Lisa P. Jacobson, Alv

Journal:

Gastroenterology

Year:

2004

Language:

english

File:

PDF, 205 KB

english, 2004

16

[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Comparing the parameters of PSP and BSIM4 models for 65 nm MOSFETs before and after hot-carrier stress

Chen, Shuang-Yuan, Chen, Yu, Wu, Meng-Chiuan, Huang, Heng-Sheng, King, Chin-Lung, Wu, Shin-Yi

Year:

2011

Language:

english

File:

PDF, 295 KB

english, 2011

17

[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - Characteristics and hot-carrier effects of strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor

Peng, Min-Ru, Wang, Mu-Chun, Ji, Liang-Ru, Huang, Heng-Sheng, Chen, Shuang-Yuan, Wang, Shea-Jue, Hsu, Hong-Wen, Liao, Wen-Shiang

Year:

2013

Language:

english

File:

PDF, 1.08 MB

english, 2013

18

[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Deterioration of junction performance with temperature effect for 45 nm Si-capping MOSFETs on silicon substrate

Wang, Mu-Chun, Hu, You-Ming, Lin, Long-Sian, Chen, Shuang-Yuan, Liao, Wen-Shiang, Yang, Hsin-Chia, Yang, Ren-Hau, Peng, Ssu-Hao

Year:

2011

Language:

english

File:

PDF, 293 KB

english, 2011

19

Temperature dependence of substrate currents of MOSFETs under different drain and gate biases

Liu, Chuan-Hsi, Chen, Shuang-Yuan, Tu, Chia-Hao, Huang, Heng-Sheng, Chou, Sam, Ko, Joe

Journal:

Journal of the Chinese Institute of Engineers

Year:

2011

Language:

english

File:

PDF, 448 KB

english, 2011

20

[IEEE EM 2011) - Changchun, China (2011.09.3-2011.09.5)] 2011 IEEE 18th International Conference on Industrial Engineering and Engineering Management - Technology innovation problems research in chain link of Commercial Aircraft Corporation of China

Wang, Shuang-yuan, Chen, Lin, Wei, Lin-wan

Year:

2011

Language:

english

File:

PDF, 218 KB

english, 2011

21

[IEEE 2013 2nd International Symposium on Next-Generation Electronics (ISNE 2013) - Kaohsiung (2013.2.25-2013.2.26)] 2013 International Symposium on Next-Generation Electronics - Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses

Mu-Chun Wang,, Min-Ru Peng,, Liang-Ru Ji,, Heng-Sheng Huang,, Shuang-Yuan Chen,, Shea-Jue Wang,, Hong-Wen Hsu,, Wen-Shiang Liao,, Chuan-Hsi Liu,

Year:

2013

Language:

english

File:

PDF, 1.34 MB

english, 2013

22

[IEEE 2013 2nd International Symposium on Next-Generation Electronics (ISNE 2013) - Kaohsiung (2013.2.25-2013.2.26)] 2013 International Symposium on Next-Generation Electronics - Trend of subthreshold swing with DPN process for 28nm N/PMOSFETs

Mu-Chun Wang,, Chong-Kuan Du,, Min-Ru Peng,, Shea-Jue Wang,, Shuang-Yuan Chen,, Chuan-Hsi Liu,, Cheng, O., Huang, L. S., Shih Ching Lee,

Year:

2013

Language:

english

File:

PDF, 1.19 MB

english, 2013

23

[IEEE High Density Packaging (ICEPT-HDP) - Xi'an, China (2010.08.16-2010.08.19)] 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging - Efficiency of dispenser with nozzle technology in assembly

Wang, Mu-Chun, Kuo-Shu Huang,, Shuang-Yuan Chen,, Zhen-Ying Hsieh,, Hsin-Chia Yang,, Chuan-Hsi Liu,, Chii-Ruey Lin,

Year:

2010

Language:

english

File:

PDF, 1.04 MB

english, 2010

24

[IEEE 2010 International Symposium on Next-Generation Electronics (ISNE) - Kaohsiung, Taiwan (2010.11.18-2010.11.19)] 2010 International Symposium on Next Generation Electronics - CESL deposition promoting n/p MOSFETs under 45-nm-node process fabrication

Wang, Mu-Chun, Yang, Hsin-Chia, Liao, Wen-Shiang, Yang, Hsiu-Yen, Hoe, Yao-Yuan, Lin, Kuang-Hung, Chen, Shuang-Yuan

Year:

2010

Language:

english

File:

PDF, 1.21 MB

english, 2010

25

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Extra-Inversion Charge Enhancing Substrate Current During Increased Substrate Bias in 90 nm Process

Wang, Mu-Chun, Hsieh, Zhen-Ying, Tu, Chia-Hao, Chen, Shuang-Yuan, Chen, Hung-Wen, Chuang, Ai-Erh, Huang, Heng-Sheng, Chou, Sam

Year:

2008

Language:

english

File:

PDF, 410 KB

english, 2008

26

[IEEE 2006 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2006.10.16-2006.09.19)] 2006 IEEE International Integrated Reliability Workshop Final Report - Temperature Effects on the Hot-Carrier Induced Degradation of pMOSFETs

Chen, Shuang-yuan, Tu, Chia-hao, Lin, Jung-chun, Kao, Po-wei, Lin, Wen-cheng, Jhou, Ze-wei, Chou, Sam, Ko, Joe, Haung, Heng-sheng

Year:

2006

Language:

english

File:

PDF, 3.81 MB

english, 2006

27

Positive bias temperature instability in p-type metal-oxide-semiconductor devices with HfSiON/SiO2 gate dielectrics

Samanta, Piyas, Huang, Heng-Sheng, Chen, Shuang-Yuan, Liu, Chuan-Hsi, Cheng, Li-Wei

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 1.77 MB

english, 2014

28

[IEEE 2013 2nd International Symposium on Next-Generation Electronics (ISNE 2013) - Kaohsiung (2013.2.25-2013.2.26)] 2013 International Symposium on Next-Generation Electronics - Electrical performance of a-Si:H and poly-Si TFTs with heating stress

Shea-Jue Wang,, Ssu-Hao Peng,, You-Ming Hu,, Shuang-Yuan Chen,, Heng-Sheng Huang,, Mu-Chun Wang,, Hsin-Chia Yang,, Chuan-Hsi Liu,

Year:

2013

Language:

english

File:

PDF, 886 KB

english, 2013

29

Gate-to-drain capacitance verifying the continuous-wave green laser crystallization n-TFT trapped charges distribution under dc voltage stress

Hsieh, Zhen-Ying, Wang, Mu-Chun, Chen, Shuang-Yuan, Chen, Chih, Huang, Heng-Sheng

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 686 KB

english, 2009

30

[IEEE 2010 International Symposium on Next-Generation Electronics (ISNE) - Kaohsiung, Taiwan (2010.11.18-2010.11.19)] 2010 International Symposium on Next Generation Electronics - Study of nano-regime strained MOSFETs with temperature effects

Yang, Hsin-Chia, Liao, Wen-Shiang, Peng, Min-Ru, Wang, Mu-Chun, Hsieh, Zhen-Ying, Chen, Shuang-Yuan, Huang, Heng-Sheng

Year:

2010

Language:

english

File:

PDF, 1.11 MB

english, 2010

31

Interface trap generation and recovery mechanisms during and after positive bias stress in metal-oxide-semiconductor structures

Samanta, Piyas, Huang, Heng-Sheng, Chen, Shuang-Yuan, Tzeng, Tsung-Jian, Wang, Mu-Chun

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 804 KB

english, 2012

32

[IEEE IEEE International Workshop on Antenna Technology Small Antennas and Novel Metamaterials, 2006. - Crowne Plaza Hotel, White Plains, New York (March 6-8, 2006)] IEEE International Workshop on Antenna Technology Small Antennas and Novel Metamaterials, 2006. - Characteristics of UWB Bands Measurement, Human Effect, and Power Absorption

Sheng-Yi Huang,, Guan-Yu Chen,, Yun-Ta Chen,, Jwo-Shiun Sun,, Shuang-Yuan Chen,

Year:

2006

Language:

english

File:

PDF, 355 KB

english, 2006

33

Atom-atom interaction in an anisotropic photonic crystal

Xie, Shuang-Yuan, Yang, Ya-Ping, Chen, Hong, Zhu, Shi-Yao

Journal:

Journal of Modern Optics

Year:

2003

Language:

english

File:

PDF, 1.38 MB

english, 2003

34

[IEEE 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2009.10.21-2009.10.23)] 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference - Influence of plastic assembly yield with molding technology

Mu-Chun Wang,, Kuo-Shu Huang,, Zhen-Ying Hsieh,, Hsiang-Lin Yang,, Shuang-Yuan Chen,, Shou-Kong Fan,

Year:

2009

Language:

english

File:

PDF, 1.58 MB

english, 2009

35

[IEEE 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2009.10.21-2009.10.23)] 2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference - Efficiency analysis of electroplating gold bump in assembly

Mu-Chun Wang,, Kuo-Shu Huang,, Zhen-Ying Hsieh,, Chiao-Hao Tu,, Shuang-Yuan Chen,, Heng-Sheng Huang,

Year:

2009

Language:

english

File:

PDF, 1.64 MB

english, 2009

36

Tuning Perovskite Morphology by Polymer Additive for High Efficiency Solar Cell

Chang, Chun-Yu, Chu, Cheng-Ya, Huang, Yu-Ching, Huang, Chien-Wen, Chang, Shuang-Yuan, Chen, Chien-An, Chao, Chi-Yang, Su, Wei-Fang

Journal:

ACS Applied Materials & Interfaces

Year:

2015

Language:

english

File:

PDF, 1.70 MB

english, 2015

37

ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - Reliability Characteristics of D

Tu, Chia-Hao, Chiu, Fu-Chien, Chen, Chun-Heng, Hou, Cheng-Hao, Lee, Zi-Jay, Chen, Hung-Wen, Chen, Shuang-Yuan, Huang, Heng-Sheng, Wu, Tai-Bor, Hwang, Huey-Liang

Year:

2010

Language:

english

File:

PDF, 418 KB

english, 2010

38

Interfacial and Electrical Characterization in Metal–Oxide–Semiconductor Field-Effect Transistors with CeO 2 Gate Dielectric

Chiu, Fu-Chien, Chen, Shuang-Yuan, Chen, Chun-Heng, Chen, Hung-Wen, Huang, Heng-Sheng, Hwang, Huey-Liang

Journal:

Japanese Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 501 KB

english, 2009

39

The Influence of Hf-Composition on Atomic Layer Deposition HfSiON Gated Metal–Oxide–Semiconductor Field-Effect Transistors after Channel-Hot-Carrier Stress

Chen, Shuang-Yuan, Chen, Hung-Wen, Liu, Chuan-Hsi, Cheng, Li-Wei

Journal:

Japanese Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 897 KB

english, 2009

40

Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for n-Channel Metal–Oxide–Semiconductor Field-Effect-Transistor of 0.13 µm Technology

Lin, Jung-Chun, Chen, Shuang-Yuan, Chen, Hung-Wen, Jhou, Ze-Wei, Lin, Hung-Chuan, Chou, Sam, Ko, Joe, Lei, Tien-Fu, Haung, Heng-Sheng

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 590 KB

english, 2006

41

Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications

Chen, Shuang-Yuan, Lin, Jung-Chun, Chen, Hung-Wen, Lin, Hung-Chuan, Jhou, Ze-Wei, Chou, Sam, Ko, Joe, Lei, Tien-Fu, Haung, Heng-Sheng

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 237 KB

english, 2006

42

Defect Generation and Severity Comparison of Negative Bias Temperature Stress-Induced Degradation on 90 nm p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors with Different Oxide Thicknesses

Chen, Shuang-Yuan, Tu, Chia-Hao

Journal:

Japanese Journal of Applied Physics

Year:

2010

Language:

english

File:

PDF, 441 KB

english, 2010

43

High-performance xLi2MnO3·(1-x)LiMn1/3Co1/3Ni1/3O2 (0.1≤x≤0.5) as Cathode Material for Lithium-ion Battery

Yi, Ting-Feng, Tao, Wei, Chen, Bin, Zhu, Yan-Rong, Yang, Shuang-Yuan, Xie, Ying

Journal:

Electrochimica Acta

Year:

2016

Language:

english

File:

PDF, 2.37 MB

english, 2016

44

[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Effect of nitridation of hafnium silicate gate dielectric on positive bias temperature instability in pMOS devices

Samanta, Piyas, Huang, Heng-Sheng, Chen, Shuang-Yuan, Liu, Chuan-Hsi

Year:

2014

Language:

english

File:

PDF, 657 KB

english, 2014

45

[ASME 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Clear Water Bay, Kowloon, Hong Kong (Tuesday 3 June 2008)] 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems - Avoidance of Bonding Pad Contamination Affecting Back-End Assembly Process

Wang, Mu-Chun, Huang, Kuo-Shu, Hsieh, Zhen-Ying, Chen, Shuang-Yuan, Huang, Heng-Sheng

Year:

2008

Language:

english

File:

PDF, 243 KB

english, 2008

46

Thermal Casimir-Polder forces on a V-type three-level atom

Xu, Chen-Ran, Xu, Jing-Ping, Al-amri, M., Zhu, Cheng-Jie, Xie, Shuang-Yuan, Yang, Ya-Ping

Journal:

Physical Review A

Year:

2017

Language:

english

File:

PDF, 452 KB

english, 2017

47

[IEEE 2017 6th International Symposium on Next-Generation Electronics (ISNE) - Keelung (2017.5.23-2017.5.25)] 2017 6th International Symposium on Next Generation Electronics (ISNE) - Decoupled tunneling and GIDL effects for 28nm high-k stacked nMOSFETs

Mu-Chun Wang,, Ko-Chin Hsu,, Jin-Wei Guo,, Heng-Sheng Huang,, Shuang-Yuan Chen,, Shea-Jue Wang,

Year:

2017

Language:

english

File:

PDF, 253 KB

english, 2017

48

[IEEE 2017 6th International Symposium on Next-Generation Electronics (ISNE) - Keelung (2017.5.23-2017.5.25)] 2017 6th International Symposium on Next Generation Electronics (ISNE) - I-V model of nano nMOSFETs incorporating drift and diffusion current

Wei-Lun Wang,, Heng-Sheng Huang,, Yu-Hao Chao,, Shuang-Yuan Chen,, Shea-Jue Wang,, Fu-Yuan Duan,, Mu-Chun Wang,

Year:

2017

Language:

english

File:

PDF, 338 KB

english, 2017

49

[IEEE 2017 6th International Symposium on Next Generation Electronics (ISNE) - Keelung, Taiwan (2017.5.23-2017.5.25)] 2017 6th International Symposium on Next Generation Electronics (ISNE) - Voltage stress exposing degradation rate of 28nm HK/MG nMOSFETs under different nitridation annealing temperatures

Tuan, Fu-Yuan, Sung, Shun-Ping, Hsieh, Tzu-Hao, Chang, Ching-Tang, Chen, Shuang-Yuan, Wang, Mu-Chun

Year:

2017

Language:

english

File:

PDF, 416 KB

english, 2017

50

Preparation, characterization and catalytic performance of Ag/Ce/La co-modified TiO 2 photocatalysts

Zi-shang, Chen, Xiao-ping, Liang, Shuang-yuan, Zhu, Di, Zhang, Shan-min, Yang, Xiao, Yao, Jia-qi, Zhao, Huang-ying, Wang, Jian-xin, Li

Journal:

Year:

2018

Language:

english

File:

PDF, 1.30 MB

english, 2018

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